Conference Abstracts

Calibration of an optoelectronic system for the characteristion of ultraviolet sensitive photodiodes

Louwrens Van Schalkwyk, Walter E. Meyer, Jackie M. Nel, F. Danie Auret
Suid-Afrikaanse Tydskrif vir Natuurwetenskap en Tegnologie | Vol 30, No 1 | a96 | DOI: https://doi.org/10.4102/satnt.v30i1.96 | © 2011 Louwrens Van Schalkwyk, Walter E. Meyer, Jackie M. Nel, F. Danie Auret | This work is licensed under CC Attribution 4.0
Submitted: 20 September 2011 | Published: 21 October 2011

About the author(s)

Louwrens Van Schalkwyk, University of Pretoria, South Africa
Walter E. Meyer, University of Pretoria, South Africa
Jackie M. Nel, University of Pretoria, South Africa
F. Danie Auret, University of Pretoria, South Africa


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Abstract

Spectral and electrical characteristion of ultraviolet (UV) sensitive photodiodes requires a calibrated optoelectronic system. For spectral characteristion, the irradiance of the UV light source, after the light passed through a monochromator and optical fiber, was calibrated for wavelengths ranging from 200 nm to 400 nm. Commercially available AlGaN-based photodiodes was characterised and the obtained parameters were compared to that specified.


Keywords

AlGaN; ultraviolet; photodiode; optoelectronic

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